Studying the Crystalline Structure of Materials Using X - ray Diffraction

Abstract

The objective of this work is to study the crystalline structure of the materials as well as their properties and the components of the material, three different samples (ceramic, mica, chromium) were used. The properties and components of each sample were studied and the crystalline structure, using X-ray diffraction and Bragg law was investigated. From Bragg low, the interplanar spacing (d) calculated, it was found that (d) for the first sample equal 1.3698nm, which is the same for the standard data that stands for Mica, while (d) for the second sample is equal to 0.9096nm which is identical to the ceramics according to standard data. The interplanar spacing (d) for the third samples howed the Chromium element