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The effect of magnetic flux on the efficiency of the silicon cell using experimental and quantum mechanical approaches

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dc.contributor.author Ahmed, Sawsan Ahmed Elhouri
dc.date.accessioned 2014-02-13T08:32:08Z
dc.date.available 2014-02-13T08:32:08Z
dc.date.issued 2006-10-01
dc.identifier.citation Ahmed,Sawsan Ahmed Elhouri .The effect of magnetic flux on the efficiency of the silicon cell using experimental and quantum mechanical approaches/Sawsan Ahmed Elhouri Ahmed; Mubark Dirar Abd-Alla.-Khartoum:Sudan University of Science and Technology,College of Science,2006.-312p. : ill. ; 28cm.-PhD. en_US
dc.identifier.uri http://hdl.handle.net/123456789/3480
dc.description Thesis en_US
dc.description.abstract In this work a useful expression for current generated by light in semiconductors is obtained by utilizing quantum theory. It is found that this expression shows dependence of this current on electric susceptibility, Einstein absorption coefficient as well as energy gap. This expression coincides with the classical one in the special case. Experimental results show that the magnetic field and radiation affect the susceptibility and energy gap, the effect on susceptibility is determined via open voltage characteristics and refractive index change, while the effect on energy gap is found from experimental data by using some special theoretical and graphical relations with aid of least square method. The effect of magnetic field on electric susceptibility is observed in interference experiments and results are in conformity with theoretical predications. The low magnetic field is observed to increase the energy gap, this is also explained theoretically. en_US
dc.description.sponsorship Sudan University of Science and Technology en_US
dc.language.iso en en_US
dc.publisher Sudan University of Science and Technology en_US
dc.subject Physics en_US
dc.subject Magnetic flux en_US
dc.title The effect of magnetic flux on the efficiency of the silicon cell using experimental and quantum mechanical approaches en_US
dc.type Thesis en_US


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