Please use this identifier to cite or link to this item: https://repository.sustech.edu/handle/123456789/8053
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dc.contributor.authorOsman, Mustafa Osman Ali
dc.contributor.authorSupervisor - Abd Alrasol Jabar Alzubaidy
dc.date.accessioned2014-11-17T07:31:51Z
dc.date.available2014-11-17T07:31:51Z
dc.date.issued2006-12-01
dc.identifier.citationOsman,Mustafa Osman Ali .Design & Implementation of Integrated Circuit Tester/Mustafa Osman Ali Osman;Abd Alrasol Jabar Alzubaidy.-Khartoum:Sudan University of Science & Technology,College of Engineering,2006.-68P. : ill. ; 28Cm.-M.Sc.en_US
dc.identifier.urihttp://repository.sustech.edu/handle/123456789/8053
dc.descriptionThesisen_US
dc.description.abstractNowadays, technology has been consecutively developing. However, silicon technique (semiconductors), which had made great development, specially integrated circuits (ICs). The ICs consist of a large different number of electronic components packaged in small size with many inputs and outputs. This makes their test more difficult and complexity. This work is about designing and implementation of a simple TTL ICs tester using a personal computer. This tester composed of hardware design matching with the CPU by special software. The hardware is to equip the device under the test (DUT), and format the signaling flow. Since the software provides interfacing technique, testing signals, get the device response, and view the result of testing. In addition the software offers an attractive testing environment easy to deal with. The result of testing the project showed that it could check TTL IC easily and fast. The test proves the accuracy of the designed tester to evaluate ICs under test according to their datasheets and truth table.en_US
dc.description.sponsorshipSudan University of Science & Technologyen_US
dc.language.isoenen_US
dc.publisherSudan University of Science & Technologyen_US
dc.subjectElectronic Engineeringen_US
dc.subjectComputer Engineeringen_US
dc.subjectIntegrated Circuit Testeren_US
dc.subjectCircuiten_US
dc.titleDesign & Implementation of Integrated Circuit Testeren_US
dc.typeThesisen_US
Appears in Collections:Masters Dissertations : Engineering

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