Abstract:
Radiation technicians usually exposed for different levels of X-rays while they are working, which may cause the potential damages.
To avoid this case they must use monitoring devices such as Film Badge, TLD Badge or Pocket Dosimeter.
In this study a film was prepared film by dissolving PVA powder (5 wt %) in distilled water under the controlled water bath at 60-70 oC and continuous stirring for 3 hours.
After that, concentration of 0.2 wt% of AgNO3 was added in a dark room and stirred for 2 hours. The blend solutions were poured into Petri-Dishes and keep it to dry under ambient temperature for 3 days in a dark room.
Then the film was exposed to different energies of time from the X-ray mechanic then used UV/Vis spectrophotometer.
Then the intensity of light passing through the film (I) was measured, and compared it to the intensity of light before it passes through the film (IO).
and was found that when increased the level of dose the level of the film absorption was increased and when the dose level decreased the film absorption was decreased and the highest absorption is accuse at dose 368Gy and the lowest absorption at 288Gy because the dose increases due to the reduction of Ag+ to Ag0, but the band gap decreases from 3.14749E-30eV to 2.96224E-30eV when the doses increased from 288Gy to 368Gy.